A.  Introduction

  CMI900 is a cost effective, high performance XRF analyzer for measurement of coating thickness and material composition. 

B.  Specification

1.    Measure the thickness or composition of plating, coating, thin films from Ti to U.

2.    5 layers / 15 elements / Common elements correction.

3.    Composition analysis of up to 15 elements simultaneously.

4.    Measurement method according to ISO 3497, ASTM B568 and DIN 50987.

5.    X-ray excitation: 50 W (50kV and 1mA) micro-focused W anode tube.

6.    Detector: Xe filled proportional counter with secondary filtering.

7.    Computer: Pentium D, 3.0 GHz, 160Gb HD, 512Mb RAM with Microsoft TM XP **equivalent or better.

8.    Power supply: 85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz.

9.    Working Environment: 50℉(10℃) to 104℉ (40℃) and up to 98% RH, non-condensing.

10. Table Travel (XYZ programmable): 6 X 7 x 1.9” (15.2 X 17.8 X 4.8cm).

11. Multiple Collimators: optimize the balance between count rate and spot sizes.

12. Laser Focus: Improves system reproducibility (operator independent).

13. Slotted Chamber with motorized Z axis control: 3 base options (fixed, mini-well, programmable).

14. Standard FP Software Package: complex application modeling, and ease of calibration.